（××代表實驗中激光束斑和頻率的數值，根據具體實驗條件填寫。鋯石常規分析條件為32 µm和5 Hz）
U-Pb dating and trace element analysis of zircon were simultaneously conducted by LA-ICP-MS at the Wuhan SampleSolution Analytical Technology Co., Ltd., Wuhan, China. Detailed operating conditions for the laser ablation system and the ICP-MS instrument and data reduction are the same as description by Zong et al. (2017). Laser sampling was performed using a GeolasPro laser ablation system that consists of a COMPexPro 102 ArF excimer laser (wavelength of 193 nm and maximum energy of 200 mJ) and a MicroLas optical system. An Agilent 7700e ICP-MS instrument was used to acquire ion-signal intensities. Helium was applied as a carrier gas. Argon was used as the make-up gas and mixed with the carrier gas via a T-connector before entering the ICP. A “wire” signal smoothing device is included in this laser ablation system (Hu et al., 2015). The spot size and frequency of the laser were set to ××µm and ××Hz, respectively, in this study. Zircon 91500 and glass NIST610 were used as external standards for U-Pb dating and trace element calibration, respectively. Each analysis incorporated a background acquisition of approximately 20-30 s followed by 50 s of data acquisition from the sample. An Excel-based software ICPMSDataCal was used to perform off-line selection and integration of background and analyzed signals, time-drift correction and quantitative calibration for trace element analysis and U-Pb dating (Liu et al., 2008; Liu et al., 2010). Concordia diagrams and weighted mean calculations were made using Isoplot/Ex_ver3 (Ludwig, 2003).
（The real in-situ U-Pb dating of zircon in thin-section can cite reference of Zong et al. (2010)）.
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